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The nkd-7000
Thin Film
measurement on your desk top.
The
nkd-7000 provides a unique, integrated desk top solution for all your
thin film measurement needs. Non-destructive determination of
refractive index (n), extinction coefficient (k) and film thickness
measurement (d), of single and multi-layer thin films and substrates is
achieved using the combined measurement of Transmittance and
Reflectance - simultaneously.
No sample
preparation is required and samples are mounted on a horizontal x y
platform for ease of handling and access. A range of sample platform
options are available for use with thin, flexible substrates or thick,
heavy slabs of material. We even have temperature-controlled and
XY-stepping stages for automatic film thickness and index mapping of
sample surfaces.
Spectra for thin
film analysis, may be measured using polarised (s- and p-) or
unpolarised light, at one or three fixed angles of incidence and over a
wide spectral range. These can be standard or user defined angles, (see
the nkd-8000 for
continuously variable angles of incidence).
Full data capture and film analysis takes
only 15 minutes and the powerful Pro-Optix™
control software makes the whole process
of measuring film thickness and derermining optical properties fast and
simple
A wide
selection of accessories
are available, ensuring that there is no compromise in the collected
spectra.
Why not
call Aquila today to discuss your requirements, send in your thin film
samples for measurement, or arrange a demonstration. To see the range
of features the nkd-7000 offers, please download the latest brochure.
