Complete thin
film measurement
The
Aquila nkd is used for a wide range of optical metrology applications
including QC and process development.
A small
selection of application notes are presented here for your interest. If
you would like to discuss a particular thin film measurement
application, please feel free to contact
us.
The
flexibility of the nkd makes it suitable for measuring the photometric
performance, film thickness, refractive indices, absorption and
uniformity of amongst others:
Ophthalmic
lenses• Sunglasses• Flat panel displays •
Surface Coatings & Treatments • Precision
optics• Semiconductors • Telecoms components
• CD & DVD optical systems • Solar control
glass and coatings• Automotive lenses • Visors
• Packaging materials
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