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Acquistion Wizard
1. The wizard begins by requesting
information about the sample and analysis set-up. The number of layers,
the nature of the sample, the selected incident angle and polarisation
state.
3. Most common thin film materials
are already in the Pro-Optix database, so entering the specifications
of a new sample to analyse is straightforward.
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2. The acquisition wizard walks
the user through the steps necessary to collect high-precision
transmittance and reflectance spectra. The scanning range and step are
selected and the sample position entered if an X Y mapping platform is
fitted.
4. Data collection typically takes
from two to eight minutes including the self-calibration step which the
instrument performs before every measurement. Without further operator
intervention, Pro-Optix displays the measured spectra.
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1.
Analysis of the measured spectra is performed automatically with one
click using default mode.
2.
n and k is determined and plotted automatically with no further user
input.
3.
Advanced analysis mode provides facility for defining new dispersion
models.
NKView
In addition to
Pro-Optix™, Aquila provide an additional tool to help users
find reasonable starting points for material models.
NKView can be used with Pro-Optix™ or as an independent tool
to learn about material models.
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Pro-Optix™ is also a
powerful data analysis package and is the only software required for
determining n, k and d from the measured T and R spectra.
Pro-Optix™
uses a variety of analytical models to represent the complex refractive
indices of each material in the sample. These models have been
carefully designed to make the data analysis fast and robust.
Starting
with initial values from the system's built-in database of known
optical properties, the analysis algorithms use intelligent procedures
to match the measured spectra with a theoretical model by varying the
thicknesses of the layers in the model and the parameters which define
their optical properties. n, k and d are determined quickly and simply.
If a particular material is not
already present in the extensive database, the advanced analysis mode
provides a range of tools to construct and refine a new dispersion
model. Models for new materials can then be stored in the database for
future use.
Transparent
and metallic samples are catered for in the analysis with the use of
coherence factors and metal algorithms. Facilities for solar and colour
co-ordinate calculations are also provided. s- and p- polarisation
spectra can also be combined for accurate profile matching.
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