spacer
spacer logo spacer
spacer
spacer spacer
hbtn1 hbtnhome hbtnabout hbtnnews hbtncontact hbtn2
spacer
hheadingband
spacer

Aquila Instruments manufactures the nkd, the most advanced thin film measurement instrument available. The nkd provides non destructive analysis of film thickness, refractive index and absorption for single and multi-layer films on transparent and absorbing substrates. Aquila guarantees expert support and a tailored solution to your thin film measurement application.

Please follow the links to the right for more information.

spacer spacer
spacer hmainimage spacer
spacer
spacer hresbutton hmetbutton spacerf
spacer
©Aquila Instruments 2008