No sample
preparation is required and samples are mounted on a horizontal x y
platform for ease of handling and access. A range of sample platform
options are available for use with thin, flexible substrates or thick,
heavy slabs of material. We even have temperature-controlled and
XY-stepping stages for automatic film thickness and index mapping of
sample surfaces.
Spectra for thin
film analysis, may be measured using polarised (s- and p-) or
unpolarised light, at one or three fixed angles of incidence and over a
wide spectral range. These can be standard or user defined angles, (see
the nkd-8000 for
continuously variable angles of incidence).
Full data capture and film analysis takes
only 15 minutes and the powerful Pro-Optix™
control software makes the whole process of measuring film thickness
and derermining optical properties fast and simple
A wide
selection of accessories
are available, ensuring that there is no compromise in the collected
spectra.
Why not
call Aquila today to discuss your requirements, send in your thin film
samples for measurement, or arrange a demonstration. To see the range
of features the nkd-7000 offers, please download the latest brochure.
Download pdf brochures
nkd-7000 brochure
Download
Submission Form
Sample
submission guidelines..
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